Semiconductor innovation and cost reduction cannot be accomplished without productive test solutions.  Chip manufacturers today are creating complex devices of unprecedented performance, features and functionality, straining traditional test methodologies. SEMI members in the test segment have responded with ingenious software, hardware, systems, and solutions that enable faster time-to-market, improved yield and lower cost.

• ATE Vision 2020 Workshop Call for Papers Now Open Event Seeks to Reduce Future Technology Gap
• Test Technology Bridging to the Future: Challenge of Cost Reduction (SEMICON Japan)
• CAST Test Cell Software Integration Workshop (Oct 6) in San Jose, CA
• KGD (Known Good Die) Packaging & Test Workshop (Oct 1-2) in Santa Clara, CA
• 11th European Manufacturing Test Conference (EMTC) and CAST Workshop-- at SEMICON Europa
• Test Summit Tackles the Issues 
• Collaborative Alliance for Semiconductor Test (CAST) Working Groups at SEMICON West
• New Test Solutions at SEMICON West 
• SEMICON West: News Test Strategies 
• "A New Test Industry" Executive Summit
• CAST Kick Off Meeting Update
• Presentations from the CAST Kick Off Meeting (April 1, 2009)
• Collaborative Alliance for Semiconductor Test (CAST) Joins SEMI as Special Interest Group
• Critical Issues in Test Featured at the European Manufacturing Test Conference
• US Election 2008
• New White Paper: Innovation at Risk

The SEMI International Standards Program is one of the key services offered  for the benefit of the worldwide semiconductor, PV and flat panel display (FPD) industries. Standards afford a way to meet the challenges of increasing productivity while enabling business opportunities around the globe. The program, started over 26 years ago in North America, was expanded in 1985 to include programs in Europe and Japan.  For more information, click here.

• Collaborative Alliance for Semiconductor Test (CAST) Site

• US Election 2008
• Dynamic Export Control Discussions Continue