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ITC-Asia Day 2

 Date:

 Thursday, September 14th, 2017

 Time: 

 9:00 - 16:40

 Venue:

 504abc, Taipei Nangang Exhibition Center, Hall 1, Taipei, Taiwan 

 Theme:

 

 

 Forum Chairman: 

 

 Forum Moderator: 

 

 

 Forum Outline: 

 

 

Organizer:

 

 

 

 

 

Co-organizer:

 

 

 

 

 

Sponsor:

              

 

Agenda

Time

Speaker / Topic

09:00 - 10:40

 Opening & Keynote Session (I)

 Hardware Security - Verification, Test, and Defense Mechanisms

 Prof. Tim Cheng, Dean of Engineering and Chair Professor of ECE and CSE, Hong Kong U. of Science and Technology

 

 Convergence of Electronic and Semiconductor Systems, and Its Impact on Testing Technology

 Ishih Tseng, Chroma ATE Inc.

10:40 - 11:00

 Coffee Break

11:00 - 12:20

 Plenary Panel

 Heterogeneous Integration – Design and Test Challenges

 Panelists: (Inviting)

  • Charles Chen, MediaTek

  • William Chen or Ou Li, ASE

  • Erik Jan Marinissen, IMEC

  • Douglas C.H. Yu, TSMC

  • Robert W. C. Lo, ITRI

  • Tim Cheng, HKUST

12:20 - 13:30

 Lunch Break

13:30 - 14:45

 Corporate Session (I)

 The Trend of Testing on IoT Ics

 George Chang

 Topic TBD 

 Daniel Chen

 Improved Test Quality and Efficiency Via Better Link of Design and Test

 Meir Gellis

14:45 - 15:00

 Coffee Break

15:00 - 16:40

 Corporate Session (II)

■ Programs are subject to change without prior notice. 

■ All presentations will be conducted in English. 

■ No recording/photography during the seminar.

 

Price

SEMI Member

Original Price (Aug 6 - Onsite)

 

 

 


Contact

SEMI Taiwan

Ms Grace Wang

TEL: 886.3.560.1777 EXT. 503

Email: gwang@semi.org 

 

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