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Dr. Douglas Sutherland

 

 

Dr. Douglas Sutherland

Principal Scientist

Corporate Group

KLA-Tencor

 Education:

  • Ph.D.

 Experiences:

 

  • Principal Scientist, KLA-Tencor (2000 to Present)

  • Lithography Engineer, Cypress Semiconductor (1996 to 2000)

  • Post Doctoral Fellow, Lawrence Berkeley National Laboratory (1994 to 1996)

 

 Abstract:

 

  • Chip reliability is a major concern for everyone but especially for the automotive industry.

  • This presentation will give an overview of the Best Known Methods (BKM’s) for improving chip reliability.

  • Introduction to “Inline Defect Part Average Testing” (I-PAT)

     

 

 

 

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