Dr. Douglas Sutherland



Dr. Douglas Sutherland

Principal Scientist

Corporate Group



  • Ph.D.



  • Principal Scientist, KLA-Tencor (2000 to Present)

  • Lithography Engineer, Cypress Semiconductor (1996 to 2000)

  • Post Doctoral Fellow, Lawrence Berkeley National Laboratory (1994 to 1996)




  • Chip reliability is a major concern for everyone but especially for the automotive industry.

  • This presentation will give an overview of the Best Known Methods (BKM’s) for improving chip reliability.

  • Introduction to “Inline Defect Part Average Testing” (I-PAT)





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