Dr. Tim Lin

Technical Manager of MSED/ QR
Taiwan Semiconductor Manufacturing Company Limited


  • Ph.D. in Computer Science & Engineering from UT Arlington


  • Technical Manager of TSMC’s Quality & Reliability

  • Senior Algorithm Developer of Applied Materials R&D for Inspection


•Dr. Tim Lin is currently a technical manager of TSMC’s Quality & Reliability Department. He is responsible for Image Processing and Machine Learning activities, focusing on metrology measurements, defect inspection & classification, incoming quality control, and outgoing quality assurance. Before joining TSMC, he served as an algorithm developer at Applied Materials in charge of wafer defect inspection and metrology algorithm development.

•Dr. Lin has over 10 years’ experience in Automated Optical Inspection (AOI) industry. His research interests focus on Image Processing, Computer Vision, Signal Processing, Neural Networks, Artificial Intelligence, and Data Mining.

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