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Advanced Testing Forum [Physical & On-demand]

Room 505a, 5F, TaiNEX 1 Friday, September 25
8:20am to 4:30pm

2020 Content will be updated continuously!

Date:Friday, September 25th, 2020
Time:08:50 - 16:30 (08:20-08:50 for registration)
Venue:Room505a, 5F, TaiNEX 1/ 南港展覽館一館5樓 505a會議室 

Forum Chairs:

  • Dr. Cheng-Wen Wu, Executive Vice President, NCKU;Senior Vice President, General Director of Southern Region Campus, ITRI / Co-chair of SEMI Taiwan Testing Committee
  • Mr. CJ Hsieh, General Manager, INTEL Innovation Technologies Ltd./ Co-chair of SEMI Taiwan Testing Committee

Forum Vice Chair:

  • Ms. Wendy Chen, Associate Vice President, KYEC/ Vice Chair of SEMI Taiwan Testing Committee

Moderators: 

  • Mr. Roger Hwang, Senior Director, ASE Group
  • Dr. Ching Cheng Tien, CTO, Sigurd Corporation

Theme: Next generation test architectures and systems for AIoT and 5G
Outline: 

  • Taiwan became the spot light of Semiconductor Manufacturing supply chains center.  The most advanced innovative process of Semiconductor and  creative IC design structure be realized and succeeded mass production fulfill the blooming applications in new generation communication, intelligent transportation , advance medical technologies and smart manufacture.  However , the challenges are coming along with how to ensure the manufacturing procedure could have high  production yield .  Therefore the advance test technologies are getting important and also can’t stick in the traditional testing concepts. As we know, the high percentage of test systems were composed of semiconductor IC. This traditional concepts of test system will induce a lot of problems which come from using old generation of technologies to verified novel IC with new generation of technologies.  The breakthrough test architecture and methods should be take into account with brainstorming . 
  • In this 2nd Advance Test Forum , the main theme was steamed from this concept as “The Next Generation Test Architecture and System for AIOT and 5G “ and invited specialists from the leading edge of Semiconductor supply chains to share their viewpoints. At the same time, lots of  academic researcher and professor also will participate this event together through the corporation with IEEE International Test Conference Asia which will be hold at Taiwan this year. The 2nd Advance Test Forum will be positioned as Corporate Session of IEEE International Test Conference Asia and arranged at the best part of finale to show up the best industrial practices for enriching this great event.
早鳥價
(7/13-8/31)
原價
(9/1-9/25)
SEMI 會員價
(7/13-9/25)
團報價
(7/13-9/25)

學生價 (不含EMBA)
(7/13-9/25)

NTD2,500 NTD3,150

NTD2,500

5人以上享NT$2180

NTD800
*Tax included
 
 
Sponsored by:
         
 
* Forum agenda is subject to change
 
If SEMI should be unable to hold the exhibition/forum for any cause beyond its reasonable control, SEMI has the right to cancel the exhibit/forum with no further liability than a refund of the ticket price. SEMI shall in no event be liable for incidental or consequential damages to registrants arising from or relating to such cancellation.
 
         
         
 
     
     

 

Do you want to attend this session? REGISTER NOW!

Mr. Roger Hwang
Senior Director
ASE
Mr. Terry Tsao
Global Chief Marketing Officer and President of SEMI Taiwan
SEMI
Mr. Eric Wu
Vice President of Test Engineering
Siliconware Precision Industries Co., Ltd
Dr. Ching Cheng Tien
Chief Technology Officer
Sigurd Microelectronics Corporation
Dr. Michael Li
Director
Chunghwa Precision Test Tech. Co., Ltd.
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