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Semiconductor Advanced Inspection and Metrology Forum

Room 402ab, 4F, TaiNEX 1 Friday, September 25
8:30am to 4:30pm

Date:Friday, September 25th, 2020
Time:08:30 - 16:30 (08:30-09:00 for registration)
Venue:Room 402ab, 4F, TaiNEX 1

Theme:  Innovation and Commercialization of Semiconductor Inspection and Metrology Technologies

Forum Chairs and Vice Chairs:

  • Mr. Leo Huang, Chairman & CEO, Chroma ATE Inc./Chairman, SEMI Taiwan Inspection & Metrology Committee
  • Dr. Fong-Zhi Chen, Deputy Director General, Instrument Technology Research Center, National Applied Research Laboratories/Vice Chairmen, SEMI Taiwan Inspection & Metrology Committee
  • Mr. Frank Tsai, Director, Hermes-Epitek Corporation/Vice Chairmen, SEMI Taiwan Inspection & Metrology Committee
  • Dr. Victor, Tzeng-Yow Lin, General Director, Center for Measurement Standards, Industrial Technology Research Institute/Vice Chairmen, SEMI Taiwan Inspection & Metrology Committee

Outline:  

The global semiconductor inspection equipment market size is expected to reach USD 6883.7 million by 2025, from USD 5783.5 million in 2019. However, due to the outbreak of COVID-19, the industry has been impacted by manufacturing disruption. To facilitate innovation and commercialization of semiconductor inspection and metrology technologies, measurement challenges and relevant solutions would be discussed through the Semiconductor Advanced Inspection and Metrology Forum, which provides a platform for the communication of market trends and state-of-the-art technologies.

 

 

 

Early-bird
(7/13-9/4)

Original
(9/5-9/25)

SEMI Member
(7/13-9/25)
Group Registration
(7/13-9/25)

Academia 
(EMBA Excluded)
(7/13-9/25)

NTD 3,200 NTD 4,000 NTD 3,200 Extra 10% discount
(More than 5 people)
NTD 800

*Tax Included

 
 
Organizer:
 
     

 

Sponsored by:

 

 

 

 

 

 

 

 

   

 

 
 
* Forum agenda is subject to change
 
 

If SEMI should be unable to hold the exhibition/forum for any cause beyond its reasonable control, SEMI has the right to cancel the exhibit/forum with no further liability than a refund of the ticket price. SEMI shall in no event be liable for incidental or consequential damages to registrants arising from or relating to such cancellation.

For further information, please visit our website. http://www.semicontaiwan.org/en/agenda-glance

 
 

 

 

 

       

Do you want to attend this session? REGISTER NOW!

Mr. Edward Chen
Senior sales manager
HORIBA Taiwan, lnc. / AST Instruments Corporation
Mr. Jui-Lin Yang
Consulting Director
ISTI/ITRI
Dr. Chao-Chang Chen
Deputy General Director
CMS/ITRI
Mr. Berry Tseng
Sr. Director Quality Operations at Air Liquide Electronics / International Sr. Expert
Air Liquide Group
Mr. Kevin Weng
Director
Chroma ATE Inc.
Mr. Sam Chao
Executive Vice President and President of Taiwan
SVXR, Inc.
Dr. Wei-En Fu
Convenor
WG1 Purity and particle for semiconductor raw materials, SEMI Taiwan Inspection and Metrology Committee
Dr. Hung-Ming Tai
Convenor
WG2 Advanced packaging inspection - warpage measurement on wafer or substrate, SEMI Taiwan Inspection and Metrology Committee
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