Innovative Solutions for TGV Metrology: Advanced Visualization, 3D Analysis, and Metrology-Driven Yield Management

11:20 am - 12:00 pm

Our comprehensive metrology solutions streamline Through-Glass Via (TGV) and LASER modification analysis by addressing the challenges of overwhelming data volumes. We provide advanced visualization, high-resolution 3D analysis, Panel-level 3D map, and 3D orientation analysis to deliver precise insights. Our software features metrology-based data filtering, coordinate variations analysis, GPU-accelerated high-definition visualization, and accurate statistical summaries, ensuring efficient and actionable yield management.

Key Technologies Covered

•    Comprehensive Metrology
•    GPU Accelerated Interactive HD Visualization
•    3D Reconstruction Analysis
•    Panel-level 3D
•    3D Orientation Analysis
•    Metrology-Based Data Filtering
•    Concise Data Statistics

Featured Speakers

Dr. Mohit Sharma

Senior Engineer, Research and Development, OmniMeasure Technology Inc.

Dr Mohit Sharma, Senior Engineer, OmniMeasure Technology Inc. He is a professional in metrology tool development and Chemical Mechanical Polishing (CMP), holding a Ph.D. in Mechanical Engineering from the Precision Manufacturing Lab, NTUST (Taiwan Tech), with a specialization in Thin Film Characterization, CMP Process, and Modeling.

At OmniMeasure, he is responsible for metrology software development and providing CMP and Metrology solutions. He holds a solid foundation in linear algebra, statistics, and data science, complemented by extensive academic and research experience.