Mr. Charles Lin had over 25 years’ experience for semiconductor and microscopy characterization, Since joining Carl Zeiss as a Sr. Application & Business Development Manager in 2023, currently is manage for ZEISS Innovation Center in Hsinchu(TW), lead the application team and host RD development cooperation project with key partner, previously work in FEI/TMO for more than 16 years and AMAT & Bruker for rest, most experienced in SEM/FIB/TEM technology for Failure analysis, yield enhancement and metrology, also implement in-line wafer-level TEM workflow solution for RD development, experienced on E-beam inspection & review, X-ray inspection & metrology for front-end, back-end & advance package, participated the new technology launch to meet RD & production demand.
